- Mercury Intrusion Porosimeter (MIP). Micromeritics Autopore II 9220. Automated system measures pore size distribution in the range of pore diameters between 300£gm and 3 nm. Samples can be in the form of granular powders or monoliths.
- Gas Adsorption (Nitrogen BET). Micromertics ASAP 2400. Automated system measures full adsorption and desorption isotherms over the N2 partial pressure range of 10-3 to 1. From these isotherms can be calculated the pore size distributions in the range of pore diameters between 100 nm and 1.7 nm, the BET specific surface area, micropore volume and area, and total pore volume.
- Centrifugal particle analyzer. Horiba CAPA-700. Provides particle size distributions in the range between 300 £gm and 0.01 £gm. Either aqueous or organic liquids can be used to prepare suspensions. Results are calculated according to Stoke¡¦s law.
- Helium pycnometer. Micromeritics 1330. Measures a material¡¦s apparent volume or apparent solid density.
- Mechanical testing machine. Instron 4503. Maximum load 10 kN.
- Piston extruder. Loomis 40-ton extruder with various dies.
- Twin-roll calendaring mixer. Stanat 6 x 12 inch calendaring mixer. Used in preparation of MDF materials.
- Laboratory autoclaves and reaction vessels. Parr.
- Rheometer. Brookfield.
- Hydraulic laboratory press. Carver. Has heated platens.
- X-ray diffractometer (XRD). Rigaku DMAX II. Equipped for qualitative and quantitative analysis of crystalline compounds. Analytical software includes Jade with ICCD search-match and Rietveld whole pattern fitting utilizing ICSD structural database.
- Thermal analysis (DTA, TGA, TMA, DSC). Netzsch STA 409 and Netzsch 402ES. Temperature range is -100 to 1600¢XC for simultaneous DSC/DTA/TG, room temperature to 1600¢XC for dilatometry.
- High Pressure Liquid Chromatograph (HPLC). Waters.
- Scanning Electron Microscope (SEM). Hitachi S-530. Equipped with a PGT image analysis system. The microscope includes both secondary and quadripole backscattered electron detectors. Point to point resolution in the secondary electron mode is 5.0 nm.
- Polishing equipment for SEM specimens, Buehler.
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Mercury Intrusion Porosimeter |
